UDRX_Special measurements on X'Pert PRO MRD diffractometer. Textures, residual stresses, reciprocal space maps.

Special measurements on the X'Pert PRO MRD materials equipment require time-consuming measurements, therefore we recommend contacting the technician in charge before carrying out these measurements due to the complexity of these measurements.
Texture measurements, measurement of pole figures and calculation of Orientation Distribution Functions are carried out.
Residual stress measurements are carried out, both from Psi measurements and Omega measurements.
Maps of the reciprocal space are made both in high resolution with K-alpha-1 monochromator and in low resolution.
We also carry out all types of measurements proposed by the user in which the samples are parts or thin films and which take advantage of the possibility of using the Euler cradle which allows us to take advantage of programmable movements of Phi, Psi, Omega, X, Y, Z.