Acquisition of the new Zetium X-ray Fluorescence spectrometer at the X-ray Diffraction Unit of the Complutense University of Madrid
A new Zetium X-ray Fluorescence spectrometer (Malvern-Panalytical) has been installed at the X-ray Diffraction Unit, delivering unprecedented analytical precision compared to our previous equipment.
In March 2026, a new Zetium Wavelength Dispersive X-ray Fluorescence (WDXRF) spectrometer by Malvern-Panalytical was installed. This acquisition was funded by the Community of Madrid (REDLAB) and co-funded by the European Union.
This high-performance system enables the elemental analysis of chemical elements ranging from Fluorine to Uranium, supporting various formats such as solids, loose powders, pressed pellets, fused beads, and liquids. It features a Rhodium (Rh) anode X-ray tube with a maximum power of 4 kW and an operating range of up to 60 kV and 160 mA.
The breakthrough of this new equipment lies in its ability to combine WDXRF and EDXRF techniques, allowing for Small Spot Mapping (SSM). To achieve this, it integrates an energy dispersive core, a high-precision positioning system, and a high-resolution camera for image acquisition. The SSM module supports samples up to 35 mm, with measurement spots of 500 µm (FWHM) and a minimum step size of less than 100 µm, enabling the acquisition of up to 24,000 points per sample.
Small Spot Mapping (SSM) facilitates the analysis of inclusions via XRF, accurately identifying elements and their proportions. This capability is critical for both industrial quality control and the R&D of next-generation materials.
