High-Resolution X-Ray Diffractometer (HRXRD): Malvern Panalytical Empyrean Series 3
High-Resolution X-Ray Diffraction (HRXRD): Malvern Panalytical Empyrean Series 3Equipment Description:A state-of-the-art diffractometer dedicated to the advanced analysis of thin films, microstructures, textured materials, and residual stresses. Built around a high-resolution goniometer in a horizontal configuration with a Cu X-ray tube, it features a robust, automated 5-axis stage (Eulerian cradle) for the precise positioning, alignment, and mapping of complex industrial parts, coatings, and substrates of various shapes and sizes.
-Powered by iCore and dCore automated optics technology, the system enables motorized switching between multiple optical paths without the need for manual realignment or user intervention.
-Combined with high-resolution crystals (Ge monochromator) and three independent detection systems (including cutting-edge solid-state technology), we maintain our comprehensive range of analytical services while upgrading them to the highest standards of high-resolution, versatility, and data quality.
Incident Beam Optics:
-iCore Automated Module: Motorized optics control for seamless and automated transitions between different analytical geometries.Fixed divergence slit optics.Cross-slit collimator for spot focus applications.
-Ge (220) Crystal Monochromator: Provides a strictly monochromatic primary beam Kalpha1, essential for high-resolution applications.
Diffracted Beam Optics & Detection Systems:
-dCore Automated Module: Motorized configuration of the diffracted beam path and optical components.
-Triple-Axis Configuration: Delivers ultimate angular resolution, which is fundamental for precise line profile analysis and clean reciprocal space mapping.
Triple Detection System:
-Empyrean 1der Detector: Optimized for superior fluorescence suppression and maximum data acquisition efficiency.
-PIXcel 1D Detector: Ultra-fast solid-state detector for fast reciprocal space maps and high-throughput measurements.
-Xe Sealed Proportional Detector: For traditional analytical setups and specific parallel beam measurements using a flat collimator.
-Sample Stage:Motorized 5-axis platform (Eulerian cradle with programmable Phi$, Psi, X, Y, Z movements), ideal for non-destructive testing of bulky components, texture analysis, and automated area mapping.
Applications & Available Services:
-Advanced Phase Analysis: Qualitative phase identification on all types of materials and semi-quantitative analysis on samples of complex shapes, sizes, and non-conventional geometries.
-Thin Films: Phase analysis via Grazing Incidence X-ray Diffraction (GIXRD).
-X-ray Reflectivity (XRR): Precision determination of thickness, roughness, and density in nanometric layers and multilayers.
-Texture & Orientation Analysis: Automated pole figure measurements and Orientation Distribution Function (ODF) calculation.
-Residual Stress Analysis: Stress determination using both Psi and Omega geometries on industrial parts and thin films.
-High-Resolution Reciprocal Space Mapping (HR-RSM): High-resolution mapping using the primary Ge (220) monochromator and the triple-axis configuration to evaluate strain, relaxation, period thickness, and composition in heterostructures and epitaxially grown single crystals.
-Powered by iCore and dCore automated optics technology, the system enables motorized switching between multiple optical paths without the need for manual realignment or user intervention.
-Combined with high-resolution crystals (Ge monochromator) and three independent detection systems (including cutting-edge solid-state technology), we maintain our comprehensive range of analytical services while upgrading them to the highest standards of high-resolution, versatility, and data quality.
Incident Beam Optics:
-iCore Automated Module: Motorized optics control for seamless and automated transitions between different analytical geometries.Fixed divergence slit optics.Cross-slit collimator for spot focus applications.
-Ge (220) Crystal Monochromator: Provides a strictly monochromatic primary beam Kalpha1, essential for high-resolution applications.
Diffracted Beam Optics & Detection Systems:
-dCore Automated Module: Motorized configuration of the diffracted beam path and optical components.
-Triple-Axis Configuration: Delivers ultimate angular resolution, which is fundamental for precise line profile analysis and clean reciprocal space mapping.
Triple Detection System:
-Empyrean 1der Detector: Optimized for superior fluorescence suppression and maximum data acquisition efficiency.
-PIXcel 1D Detector: Ultra-fast solid-state detector for fast reciprocal space maps and high-throughput measurements.
-Xe Sealed Proportional Detector: For traditional analytical setups and specific parallel beam measurements using a flat collimator.
-Sample Stage:Motorized 5-axis platform (Eulerian cradle with programmable Phi$, Psi, X, Y, Z movements), ideal for non-destructive testing of bulky components, texture analysis, and automated area mapping.
Applications & Available Services:
-Advanced Phase Analysis: Qualitative phase identification on all types of materials and semi-quantitative analysis on samples of complex shapes, sizes, and non-conventional geometries.
-Thin Films: Phase analysis via Grazing Incidence X-ray Diffraction (GIXRD).
-X-ray Reflectivity (XRR): Precision determination of thickness, roughness, and density in nanometric layers and multilayers.
-Texture & Orientation Analysis: Automated pole figure measurements and Orientation Distribution Function (ODF) calculation.
-Residual Stress Analysis: Stress determination using both Psi and Omega geometries on industrial parts and thin films.
-High-Resolution Reciprocal Space Mapping (HR-RSM): High-resolution mapping using the primary Ge (220) monochromator and the triple-axis configuration to evaluate strain, relaxation, period thickness, and composition in heterostructures and epitaxially grown single crystals.
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CAI Chemical Technologies
X-ray Diffraction Unit
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