Research Assistance Centres

UDRX_Conventional diffraction, grazing incidence, reflectometry, rocking curve, 2th-w thin film and parts.

Reference: UDRX_31_03
Category: Sección de Difracción de Policristal
This equipment performs all diffraction measurements on polycrystalline samples in the form of pieces or thin films in reflection geometry.
Measurements of grazing incidence in pieces and thin film for phase analysis are carried out.
Low-angle reflectometry measurements for the determination of thickness, density and roughness in thin films, and the appropriate software is also available for these analyses.
Phase analysis on samples of different shapes and sizes.
Instrumentation
Techniques
Rates
Ref.: Preparación, Piezas
User type: UCM
Amount: 4,00€
Charging unit: For Sample
Ref.: Difractograma menos de 1h
User type: UCM
Amount: 5,00€
Charging unit: For Sample
Ref.: Difratograma tiempo adicional 20 min
User type: UCM
Amount: 2,00€
Charging unit: Fraction 20 min
Ref.: Preparación, Piezas
User type: Public organization
Amount: 8,00€
Charging unit: For Sample
Ref.: Difractograma menos de 1h
User type: Public organization
Amount: 10,00€
Charging unit: For Sample
Ref.: Difratograma tiempo adicional 20 min
User type: Public organization
Amount: 4,00€
Charging unit: Fraction 20 min
Ref.: Preparación, Piezas
User type: Private organization
Amount: 16,00€
Charging unit: For Sample
Ref.: Difractograma menos de 1h
User type: Private organization
Amount: 20,00€
Charging unit: For Sample
Ref.: Difratograma tiempo adicional 20 min
User type: Private organization
Amount: 8,00€
Charging unit: Fraction 20 min
CAI Chemical Technologies
X-ray Diffraction Unit