Scanning Electron Microscope SEM

The scanning electron microscope with dispersive energy detector (SEM-EDX) JEOL JSM 820 allows to obtain microscopic images of all types of materials. The images can be obtained with secondary and backscattered electrons, the latter give us information on compositional variations of the sample, while the former allow observing the texture and morphological characteristics of the phases analyzed.The software used by the team for the acquisition, treatment and evaluation of the analyzes is the EDX Oxford ISIS-Link.