X-ray Fluorescence Spectrometry

X-ray fluorescence is based on the study of the fluorescence emissions generated after the excitation of a sample by means of an X-ray source. The radiation impinges on the sample by exciting the atoms present in it, which in turn emit radiation characteristic called X-ray fluorescence. This radiation affects the RX detector (semiconductors mainly Si (Li)). The relatively high resolution of these detectors, between 160-180 eV, allows the spectrum of fluorescence in its monochromatic components to be decomposed as a function of the difference between its energies. In this case the detector itself acts as a separating agent.