System of management of ASSISTANCE CENTERS FOR RESEARCH OF THE COMPLUTENSE UNIVERSITY OF MADRID
Tipo: Certificación
Ámbito: Nacional
Fecha: 29/12/2017
Referencia: ES11/11013.12
Norma: ISO 9001:2015
High resolution electron microscopy with corrected aberration; transmission and scanning electron microscopy
CERTIFICATE ES11/1101.12 Technical annex
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ICTS Microscopy
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