Services
- AFM Multimode nanoscope III A (BRUKER)
- Electron Probe Micro Analyzer EPMA JXA8900
- JEM ARM200CF: with corrected aberration in condensed lens
- JEM ARM300CFEG: with corrected aberration in objective lens
- Scanning electron microscope JSM6335
- Scanning electron microscope JSM6400
- Scanning electron microscope JSM7600
- Transmission microscope JEM1010
- Transmission microscope JEM1400 plus
- Transmission microscope JEM2100HT
- Transmission microscope CM200FEG
- Transmission microscope JEM3000