JEM ARM200CF: with corrected aberration in condensed lens
Reference: ARM200cF
What can be done with it? Study and structural characterization of materials (catalytic, semiconductors, alloys, mesoporous materials, polymers, biological samples, etc.). Obtaining of ultra-high resolution images working in STEM mode. Morphological and size information (TEM). Chemical mapping (STEM). Semi-quantitative compositional analysis (XEDS). Quantitative compositional analysis (EELS) GIF QUANTUM
ARM200cF C Instrumentation
Techniques
Rates
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Ref.: TARIFA A
User type:
UCM
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Amount: 250,00€
Charging unit: € / JORNADA 4 horas
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Ref.: TARIFA B
User type:
Public organization
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Amount: 375,00€
Charging unit: € / JORNADA 4 horas
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Ref.: TARIFA C
User type:
Private organization
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Amount: 800,00€
Charging unit: € / JORNADA 4 horas
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ICTS Microscopy
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