Electronic transmission microscopy with corrected aberration

The incorporation of aberration correctors to transmission electron microscopes (TEM) has triggered a succession of experimental instrumental advances. Imaging with sub-Ångstrom resolution and spectroscopic identification of single atoms in surfaces and inside the bulk are now a reality. The possibility of combining spectroscopic and imaging tools with such an unprecedented resolution allows tackling problems at the cutting edge of Materials Sciences. The great importance of this new technology is reflected by the rapid response of the international scientific community in incorporating and optimizing this new generation of microscopes.