JEM ARM200CF: WITH CORRECTED ABERRATION IN CONDENSED LENS
The JEM-ARM200CF is an electron microscope with atomic resolution capability working in TEM or STEM mode with acceleration voltages of 80-200 kV. It has a Cold Field Emission Gun (CFEG) and a CEOS spherical aberration corrector for the STEM mode, allowing the obtaining of images with resolutions up to 78 pm.
The microscope has coupled detectors for chemical analysis using XEDS (energydispersive x-ray spectroscopy) and EELS (electron energy-loss spectroscopy) with spectral resolution of 0.3eV. This complements the techniques of bright field and dark field (BF / DF) and Z contrast (HAADF) imaging techniques.
Technical specifications
Acceleration voltage: 80 - 200 kV.
Cold FEG gun.
Spatial resolution: 0.078 nm (STEM mode at 200kV).
Operating voltage: 80 , 100 and 200 kV.
CCD camera: 2K x 2K.
XEDS model OXFORD INCA.
Energy resolution: 0.3 eV.
5 detectors: 3 annular dark field and 2 bright field. Simultaneous acquisition of HAADF, BF and ABF images.
Beryllium double and single tilt goniometer from GATAN.
Cooling holder GATAN.
The microscope has coupled detectors for chemical analysis using XEDS (energydispersive x-ray spectroscopy) and EELS (electron energy-loss spectroscopy) with spectral resolution of 0.3eV. This complements the techniques of bright field and dark field (BF / DF) and Z contrast (HAADF) imaging techniques.
Technical specifications
Acceleration voltage: 80 - 200 kV.
Cold FEG gun.
Spatial resolution: 0.078 nm (STEM mode at 200kV).
Operating voltage: 80 , 100 and 200 kV.
CCD camera: 2K x 2K.
XEDS model OXFORD INCA.
Energy resolution: 0.3 eV.
5 detectors: 3 annular dark field and 2 bright field. Simultaneous acquisition of HAADF, BF and ABF images.
Beryllium double and single tilt goniometer from GATAN.
Cooling holder GATAN.
ARM200cF |
ICTS Microscopy
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