AFM Multimode nanoscope III A (BRUKER)

What kind of information can be obtained with these instruments? Surface morphology. Topography with resolution below 1 nm. Electrical conductivity (c‐AFM). Quantitative local electrical resistance measurements. Mechanical properties (QNM Peakforce). Quantitative local measurement of the elastic modulus, adhesion, stiffness, energy dissipation and deformation on surfaces. Local electrical potential (KPM). Qualitative measurements of local charge distribution. Magnetic properties (MFM). Magnetic properties analysis under magnetic fields. Nanomechanical studies by using Single Molecule Force Spectroscopy. Pull‐push experiments for inter and intra-molecular force measurements, with 1 pN resolution. Electro-chemical properties (EC‐SPM). Study of chemical reactions on surfaces under controlled environments. Piezo-electric properties (PFM). Using the tip as electrode and deformation sensor. Thermal dependence. Capacity to measure in the 250 K to 500 K range. Topography based in ambient Scanning Tunnel Microscopy (STM).