Research Assistance Centres

AFM Multimode nanoscope III A

AFM is a surface measurement technique that is based on the interaction of a tip with the surface of the sample. This technique allows the surface analysis of samples with nanometric or even atomic resolution. As a main advantage has the possibility of making measurements without any previous treatment of the sample to be measured, and without the need to use vacuum.
Ana Soubrie Gutiérrez Mayor
ICTS Microscopy