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The scanning electron microscope JSM 6335F is especially suitable for surface nano-characterization of biological samples and materials, as well as for the semi-quantitative determination of the composition of geological materials and other natures. By using backscattered electrons, a first impression of the distribution of elements and phases can be obtained in the study of materials.

Technical specifications
Field Emission gun
SEI detector
15 kV: 1.5 nm (WD 4 mm) resolution.
1 kV: 5.0 nm (WD 4 mm) resolution.
10x to 500.000x
BE detector
30 kV: 2 nm (WD 8 mm) resolution.
EDS system
ICTS Microscopy