Research Assistance Centres

Scanning Electron Microscopy (SEM)

The MEB is a technique of superficial analysis, which consists of focusing on an electrodensa sample (opaque to the electrons) a thin electron beam accelerated with energies of excitation from 0.1kV to 50kV. The electron beam is produced by a source that can be a thermionic cannon (tungsten filament or lanthanum hexaboride) or a FEG field emission canon, or Field Emission Gun. An electric potential is applied to the barrel that accelerates the electron beam through the column, which is focused by means of electromagnetic lenses on the sample. The electrons collide and interact with the sample producing several signals that can be collected according to the detectors present.
Instrumentation
Staff
Xabier Arroyo Rey
CAI Ciencias de la Tierra y Arqueometría
Geological Techniques Unit