JSM 7600F
The JSM 7600F is a scanning electron microscope that combines ultra-high resolution imaging with optimized analytical functionality. In addition, the microscope allows the visualization of samples up to 200 mm in diameter and it has a great variety of detectors for secondary electrons, backscattered electrons, EDS, WDS, BSED, CL, etc.EDS, WDS, EBSD, CL, etc.
Technical specifications
SSEI resolution:
1.0 nm (15 kV)
1.5 nm (1 kV) in GB mode
2.5 nm (1 kV) in SEM mode
Magnification:
25 to 1,000,000x (on the image size 120mm x 90mm)
Accelerating voltage:
0.1 to 30 kV
Beam current:
1 pA to 200 nA at 15 kV
Aperture angle control lens integrated
Detector Upper and lower detectors integrated
Energy Filter New r‐filter integrated
Gentle beam Integrated
Digital images:
1,280 x 960 pixels
2,560 x 1,920 pixels
5,120 x 3,840 pixels
Technical specifications
SSEI resolution:
1.0 nm (15 kV)
1.5 nm (1 kV) in GB mode
2.5 nm (1 kV) in SEM mode
Magnification:
25 to 1,000,000x (on the image size 120mm x 90mm)
Accelerating voltage:
0.1 to 30 kV
Beam current:
1 pA to 200 nA at 15 kV
Aperture angle control lens integrated
Detector Upper and lower detectors integrated
Energy Filter New r‐filter integrated
Gentle beam Integrated
Digital images:
1,280 x 960 pixels
2,560 x 1,920 pixels
5,120 x 3,840 pixels
JSM7600 |
ICTS Microscopy
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