Services
- Analysis CHN/CHNS
- AV 250 MHz - BACS-60 (Pharmacy). Use of the equipment at nigth
- AV 250 MHz - BACS-60 (Pharmacy). Use of the equipment during daylight hours
- AVIII 700 MHz - Use of the equipment (with technician) during daytime.
- AVIII 700 MHz - Use of the equipment at night.
- AVIII 700 MHZ- Sample Preparation
- AVIII HD / DPX 300 MHZ - Sample Preparation
- AVIII HD 300 MHz BACS-60 - Equipment Usage
- Data analysis
- Design and setup of optical and charged particle (ions, photoelectrons) detection systems
- Determination of exact mass of a pure compound
- Deuterated Solvents
- Development of software for instrumentation and measurement
- Elaboration of tables, graphs and figures
- Elipsometría
- Analysis of ellipsometric data
- Brewster angle or ellipsometric image
- Ellipsometric thickness measurement
- EPR Bruker EMX - Equipment use- Out of service
- EPR Bruker EMX - Sample preparation
- Espectroscopía de correlación fotónica
- Analysis of photon correlation data
- Angular intensity distribution
- Differential refraction index
- Photonic correlation spectrum
- Sample preparation for photonic correlation
- Espectroscopía infrarroja
- FTIR ATR spectrum
- FTIR transmission spectrum
- Grazing angle FTIR spectrum
- Infrared map
- Infrared spectra analysis
- Micro-FTIR spectrum
- Preparation of KBr pellet
- Sample preparation for infrared
- Search in databases
- Espectroscopía Raman
- Analysis of Raman spectra
- Raman map
- Raman or micro-Raman spectrum
- Rayleigh confocal image
- Sample preparation for Raman
- Femtosecond laser pulse characterization (FROG, Dazcope)
- Femtosecond laser pulse irradiation of electronic devices
- Femtosecond pulse shaping
- Femtosecond pulsed laser deposition of thin films and nanostructured materiales
- Fluorescence lifetimes
- Gas chromatography separation
- Gases and cryogenic liquids for variable temperatures
- Introduction to NMR
- Laser ablation, desorption/ionization and MALDI of solid samples in tandem with time-of-flight mass spectrometry
- Laser induced breakdown spectroscopy
- Laser Surface modification
- Liquid chromatography separation
- MALDI
- Mass spectra of pure compounds
- Microfabrication of materials with femtosecond laser pulses
- Molecular photochemistry, photodissociation and photofragmentation by means of velocity map ion and photoelectron imaging and nanosecond and femtosecond laser pulses
- MS-MS spectra acquisition
- NEO 300 MHz - Use of the equipment at night time
- NEO 300 MHz - Use of the equipment during daylight hours
- NEO 400 MHz WB (NMR solid state) - Equipment use and sample preparation
- NEO 500 MHz - Use of the equipment (with technician) during daytime.
- NEO 500 MHz - Use of the equipment at night.
- NEO500 MHz - Sample Preparation
- Non-rutine analysis
- nsPLD
- Photoluminescence of solid and liquid samples
- Preparation of reports
- Quantitative analyses
- Results Reports
- Sample preparation
- Sección de Difracción de Monocristal
- UDRX_Low Temperature Single Crystal X-Ray Diffraction
- UDRX_Single Crystal Diffraction at room temperature
- Sección de Difracción de Policristal
- UDRX_Access to the UDRX analysis computer
- UDRX_Conventional diffraction, grazing incidence, reflectometry, rocking curve, 2th-w thin film and parts.
- UDRX_Other measurements not included in the offered standard services
- UDRX_Powder Diffraction by reflection_Conventional measurement
- UDRX_Powder Diffraction by reflection_Conventional measurement_Self-service
- UDRX_Powder x ray diffraction in capillary transmission mode
- UDRX_Powder x ray diffraction in reflection mode in high temperature camera
- UDRX_Powder x ray diffraction in reflection mode using a low temperature camera
- UDRX_Special measurements on X'Pert PRO MRD diffractometer. Textures, residual stresses, reciprocal space maps.
- UDRX_X ray powder diffraction in reflection mode, Cu Ka1 monochromatic radiation
- UDRX_X-ray diffraction_Pharmacy lab_Powder and bulk samples_phase id, microXRD
- Sección de Fluorescencia
- UDRX_Wavelength dispersive X-Ray fluorescence / Quantitative analysis
- UDRX_Wavelength dispersive X-Ray fluorescence / Semicuantitative analysis
- UDRX_Wavelength dispersive X-Ray fluorescence / Trace-elements analysis in geological samples
- Setup of experimental systems
- training courses
- Use of femtosecond laser radiation (800 nm, 50 fs, 1 kHz, 1-3.5 mJ/pulso)
- Use of femtosecond laser radiation (800 nm, 50 fs, 1 kHz, less 1 mJ)
- Use of femtosecond laser radiation (UV-VIS-IR, 50 fs,1 kHz, several energies)
- Use of fiber spectrometers UV-VIS-IR (200-1700 nm)
- Use of intensified CCD camera with optical fiber (UV-VIS-IR)
- Use of nanosecond laser radiation (UV-VIS-IR, 8 ns,10 Hz, several energies)
- VMI